Diagnosing EMI Problems Using Real-Time Spectrum Analysis

被引：0

作者：

Terrien, Mark ^{[1
]}

机构：

[1] Keysight Technol, 1400 Fountaingrove Pkwy, Santa Rosa, CA 95403 USA

来源：

PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE | 2016年

关键词：

real-time; spectrum analysis; EMI; diagnostics;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Diagnosing and resolving EMI compliance problems caused by fast transient signals can be difficult. This paper provides an overview of real-time spectrum analysis and discusses how this new technology can be used to solve these types of real-world EMI problems.

引用

页码：29 / 33

页数：5