Dynamic characterisation of high-speed latching comparators

被引：9

作者：

Boni, A ^{[1
]}

Chiorboli, G ^{[1
]}

Morandi, C ^{[1
]}

机构：

[1] Univ Parma, Dipartimento Ingn Informaz, I-43100 Parma, Italy

来源：

ELECTRONICS LETTERS | 2000年 / 36卷 / 05期

关键词：

Bandwidth - Electric network analysis - Electric network parameters - Flip flop circuits - Power converters - Spurious signal noise;

D O I：

10.1049/el:20000369

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The internal noise of latching comparators is a critical parameter in high-speed A/D converters. A new noise measurement technique utilising a noise voltage-to-output frequency conversion approach is presented. The advantages of this technique are increased accuracy, bandwidth and ease of use.

引用

页码：402 / 404

页数：3