Electron migration in BaFCl:Eu2+ phosphors

被引：16
|
作者：
Chen, W [1 ]
Song, QQ [1 ]
Su, MZ [1 ]
机构：
[1] BEIJING UNIV, DEPT CHEM, BEIJING 100871, PEOPLES R CHINA
来源：
JOURNAL OF APPLIED PHYSICS | 1997年 / 81卷 / 07期
关键词：
D O I：
10.1063/1.364145
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Here we report the electron migration by photo- or thermostimulation in BaFCl:Eu2+. Electrons released from F centers may be trapped by other defect sites to form F aggregates or another type of F center and vice versa. This migration reduces the photostimulated luminescence efficiency, lowers the imaging plate sensitivity, and causes the difference between the optical absorption and photostimulation spectra of color centers. (C) 1997 American Institute of Physics.
引用
收藏
页码：3170 / 3174
页数：5
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