Magnetic and electric field effects of photoluminescence of excitons bound to nitrogen atom pairs in GaAs

被引:1
作者
Onomitsu, K
Okabe, T
Makimoto, T
Saito, H
Ramsteiner, M
Zhu, HJ
Kawaharazuka, A
Ploog, K
Horikoshi, Y
机构
[1] Waseda Univ, Sch Sci & Engn, Dept Elect Engn & Comp Engn, Shinjuku Ku, Tokyo 1698555, Japan
[2] Waseda Univ, Kagami Mem Lab Mat Sci & Technol, Shinjuku Ku, Tokyo 1690051, Japan
[3] NTT Basic Res Labs, Atsugi, Kanagawa 2430124, Japan
[4] Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2004年 / 43卷 / 6B期
关键词
delta doping; photoluminescence; isoelectronic trap; nitrogen atom pair; magnetic field dependence;
D O I
10.1143/JJAP.43.L756
中图分类号
O59 [应用物理学];
学科分类号
摘要
The Magnetic and electric field effects of photoluminescence of excitons bound to nitrogen atom pairs in GaAs have been investigated for nitrogen delta-doped samples grown on (001) GaAs substrates. The excitons bound to nitrogen atom pairs produce a number of photoluminescence lines. However, these lines are much fewer than those observed in uniformly nitrogen-doped samples because of the limited spacing between two-dimensionally distributed nitrogen atoms. Among these lines, those appearing at 1.488, 1.476, and 1.428 eV are the most dominant. In this study, the characteristics of these dominant lines are investigated by an applying external field. The observed phenomena are explained by assuming that there is a continuous flow of excitons from a lower to a higher binding energy state under continuous excitation. Each photoluminescence line is found to split into two or more lines without applying an external field. The lines show a further split under a magnetic field and are finally quenched when the magnetic field is increased. The photoluminescence intensity of each line is modulated by the localization of excitons by a magnetic field and by the delocalization by an electric field.
引用
收藏
页码:L756 / L758
页数:3
相关论文
共 11 条
[1]   EXCITED-STATES OF EXCITONS BOUND TO NITROGEN PAIRS IN GAP [J].
COHEN, E ;
STURGE, MD .
PHYSICAL REVIEW B, 1977, 15 (02) :1039-1051
[2]   TOWARD A THEORY OF ISOELECTRONIC IMPURITIES IN SEMICONDUCTORS [J].
FAULKNER, RA .
PHYSICAL REVIEW, 1968, 175 (03) :991-&
[3]   Extremely sharp photoluminescence lines from nitrogen atomic-layer-doped AlGaAs/GaAs single quantum wells [J].
Makimoto, T ;
Kobayashi, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1996, 35 (2B) :1299-1301
[4]   Origin of nitrogen-pair luminescence in GaAs studied by nitrogen atomic-layer-doping in MOVPE [J].
Makimoto, T ;
Saito, H ;
Kobayashi, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (3B) :1694-1697
[5]   Early manifestation of localization effects in diluted Ga-(AsN) [J].
Masia, F ;
Polimeni, A ;
von Högersthal, GBH ;
Bissiri, M ;
Capizzi, M ;
Klar, PJ ;
Stolz, W .
APPLIED PHYSICS LETTERS, 2003, 82 (25) :4474-4476
[6]   INTERMEDIATE RANGE BETWEEN N-DOPED GAP AND GAP1-XNX ALLOYS - DIFFERENCE IN OPTICAL-PROPERTIES [J].
MIYOSHI, S ;
YAGUCHI, H ;
ONABE, K ;
ITO, R ;
SHIRAKI, Y .
JOURNAL OF CRYSTAL GROWTH, 1994, 145 (1-4) :87-92
[7]   Field effect of photoluminescence from excitons bound to nitrogen atom pairs in GaAs [J].
Onomitsu, K ;
Kawaharazuka, A ;
Okabe, T ;
Makimoto, T ;
Saito, H ;
Horikoshi, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (09) :5503-5506
[8]   Photoluminescence characteristics of nitrogen atomic-layer-doped GaAs grown by MOVPE [J].
Saito, H ;
Makimoto, T ;
Kobayashi, N .
JOURNAL OF CRYSTAL GROWTH, 1997, 170 (1-4) :372-376
[9]   ISOELECTRONIC TRAPS DUE TO NITROGEN IN GALLIUM PHOSPHIDE [J].
THOMAS, DG ;
HOPFIELD, JJ .
PHYSICAL REVIEW, 1966, 150 (02) :680-&
[10]   Evolution of the electron localization in a nonconventional alloy system GaAs1-xNx probed by high-magnetic-field photoluminescence [J].
Wang, YJ ;
Wei, X ;
Zhang, Y ;
Mascarenhas, A ;
Xin, HP ;
Hong, YG ;
Tu, CW .
APPLIED PHYSICS LETTERS, 2003, 82 (25) :4453-4455