Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation

被引：127

作者：

Arteaga, Oriol ^{[1
]}

Baldris, Marta ^{[1
]}

Anto, Joan ^{[1
]}

Canillas, Adolf ^{[1
]}

Pascual, Esther ^{[1
]}

Bertran, Enric ^{[1
]}

机构：

[1] Univ Barcelona, IN2UB, Dep Fis Aplicada & Opt, Feman Grp, Catalonia, Spain

来源：

APPLIED OPTICS | 2014年 / 53卷 / 10期

关键词：

SPECTROSCOPY; POLARIMETER; PARAMETERS;

D O I：

10.1364/AO.53.002236

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitative the polarized light microscopy technique. In this instrument all the elements of the MU are simultaneously determined from the analysis in the frequency domain of the time-dependent intensity of the light beam at every pixel of the camera. The variations in intensity are created by the two compensators continuously rotating at different angular frequencies. A typical measurement is completed in a little over one minute and it can be applied to any visible wavelength. Some examples are presented to demonstrate the capabilities of the instrument. (C) 2014 Optical Society of America

引用

页码：2236 / 2245

页数：10

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