Second Harmonic Generation from Bi3.75La0.25Ti3O12 Thin Films Grown by Sol-gel Method

被引：1

作者：

Min, Haesik ^{[1
]}

Jeon, Yoonnam ^{[1
]}

Park, Sungmin ^{[1
]}

Kwon, Hyosang ^{[1
]}

Pak, Jaemoon ^{[1
]}

Park, Doyoung ^{[1
]}

Song, Sanghoon ^{[1
]}

Cheong, Hyeonsik ^{[1
]}

Park, Gwangseo ^{[1
]}

Kim, Hyunjung ^{[1
]}

Kim, Doseok ^{[1
]}

机构：

[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2009年 / 55卷 / 03期

关键词：

BLT thin film; Second-harmonic generation; SHG phase measurement; X-ray diffraction; Raman; BISMUTH TITANATE; FERROELECTRIC PROPERTIES; OPTICAL-PROPERTIES; MICROSCOPY; FATIGUE; FIELD; AXIS;

D O I：

10.3938/jkps.55.1278

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Ferroelectric Bi3.75La0.25Ti3O12 (BLT) thin films were grown on Pt(111)/Ti/SiO2/Si substrates by repeatedly using the sol-gel method at an 800 degrees C annealing temperature. Varying the film thickness via the number of applied sol-gel processes hardly changed the bulk structure as verified by X-ray diffraction and Raman spectroscopy. The optical second-harmonic signal showed no appreciable change either while the phase of the generated second-harmonic signal increased gradually with the film's thickness, suggesting that the second-harmonic signal originated from the buried, bottom BLT layer.

引用

页码：1278 / 1281

页数：4

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