Innovative HF Extraction Procedure of the Characteristic Impedance for Embedded Planar Transmission Line on High Conductive Si Substrate

被引：0

作者：

Fourneaud, L. ^{[1
]}

Lacrevaz, T. ^{[1
]}

Charbonnier, J. ^{[2
]}

Farcy, A. ^{[3
]}

Flechet, B. ^{[1
]}

机构：

[1] Univ Savoie, IMEP LAHC, UMR CNRS 5130, F-73376 Le Bourget Du Lac, France

[2] CEA, LETI Minatec, F-38054 Grenoble 9, France

[3] STMicroelectronics, F-38926 Crolles, France

来源：

2010 ASIA-PACIFIC MICROWAVE CONFERENCE | 2010年

关键词：

de-embedding; characteristic impedance; ABCD matrix; TRL calibration; propagation constant; Silicon substrate;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper proposes an innovative and convenient de-embedding method. It is based on the properties modification of a material which is integrated in the architecture of a two ports planar circuit. The main advantage of this technique is that it does not need other complementary circuits to extract the ABCD matrix of the half of the two ports circuit. It also presents a good accuracy as this method is applied to extract the characteristic impedance and the propagation constant of a coplanar transmission line.

引用

页码：606 / 609

页数：4

共 17 条

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