Friction force measurements of electron beam-cured polyurethane acrylate films by scanning probe microscopy

被引:0
作者
Miyata, T [1 ]
Yamaoka, T
机构
[1] Oji Paper Co Ltd, Adv Technol Res Lab, Koto Ku, Tokyo 1358558, Japan
[2] Seiko Instruments Inc, Sci Instruments Div, Chiba 2702222, Japan
关键词
scanning probe microscopy; friction force; surface free energy; polyurethane acrylate; electron beam curing; silicone;
D O I
10.1295/koron.59.415
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
In this study, Scanning Probe Microscopy (SPM) was employed to determine the micro-scale friction force of silicone-treated polymer film surface. Polyurethane acrylates cured by an electron beam (EB) were utilized as polymer films. The micro-scale friction force obtained by SPM was compared with macro-scale data, such as surface free energy determined by the Owens-Wendt method and macro-scale friction coefficient determined by the ASTM method. These comparisons showed that a good linear relationship existed between the surface free energy and the friction force, which was insensitive to the nature of polymer specimens or to the silicone-treatment methods. Good linearity was also observed between the macro-scale and the micro-scale friction force. We conclude that SPM will become a powerful tool in this field of polymer science.
引用
收藏
页码:415 / 420
页数:6
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