Combined Linear-Logarithmic CMOS Image Sensor with FPN Calibration

被引：0

作者：

Cui, Shuang ^{[1
]}

Mu, Yusong ^{[1
]}

Ding, Ning ^{[1
]}

Jiang, Jiaqi ^{[1
]}

Chang, Yuchun ^{[1
]}

机构：

[1] Jilin Univ, Coll Elect Sci & Engn, Changchun 130012, Jilin, Peoples R China

来源：

PROCEEDINGS OF 2018 IEEE INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUITS, TECHNOLOGIES AND APPLICATIONS (ICTA 2018) | 2018年

关键词：

CMOS image sensor; linear-logarithmic response; phototransistor; fixed pattern noise;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a charge compensated phototransistor for a high dynamic range linear-logarithmic CMOS image sensor. The pixel is based on the four-transistor active pixel structure which can automatically switch between the linear mode and logarithmic mode according to the incident light intensity. This paper also proposes a fixed pattern noise (FPN) correction technique for the proposed pixel sensor. The FPN caused by the threshold voltage variation of the transfer gate is corrected by the calibration method of two-step charge transfer. The prototype sensor consisting of a 160 x 200 pixel array with the pixel pitch of 8 x 8 mu m(2) is fabricated with a 0.18 gm 1P6M standard CMOS process. It is found that the dynamic range is achieved 169 dB and the FPN is reduced by 80%.

引用

页码：128 / 129

页数：2

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