Smooth Nonnegative Matrix Factorization for Defect Detection Using Microwave Nondestructive Testing and Evaluation

被引:35
作者
Gao, Bin [1 ]
Zhang, Hong [2 ]
Woo, Wai Lok [2 ]
Tian, Gui Yun [1 ,2 ]
Bai, Libing [1 ]
Yin, Aijun [2 ,3 ]
机构
[1] Univ Elect Sci & Technol China, Sch Automat Engn, Chengdu 611731, Sichuan, Peoples R China
[2] Newcastle Univ, Sch Elect & Elect Engn, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
[3] Chongqing Univ, Coll Mech Engn, State Key Lab Mech Transmiss, Chongqing 400044, Peoples R China
基金
英国工程与自然科学研究理事会; 中国国家自然科学基金;
关键词
Defect detection; nondestructive testing and evaluation (NDT&E); nonnegative matrix factorization; open-ended waveguide; smoothness; source separation; SURFACE CRACKS; SHAPE RECONSTRUCTION; DIVERGENCE; SYSTEMS; METALS; LOCATION; SENSORS; PROBE;
D O I
10.1109/TIM.2013.2287126
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper addresses the interpolation issue of current spectral estimation methods in microwave-based nondestructive testing and evaluation. We developed a spatial-frequency feature extraction algorithm for defect detection with an open-ended waveguide system using smooth Itakura-Saito nonnegative matrix factorization. In addition, the mathematical models of spatial-frequency characteristics for both defects and nondefects areas are derived. The newly developed algorithm has two prominent characteristics, which benefit the detection system. First, it is scale-invariant in the sense that spatial-frequency features that are characterized by large dynamic range of energy can be extracted more efficiently. Second, it imposes smoothness constraint on the solution to enhance the spatial resolution of defect detection. To evaluate the proposed technique, we demonstrate the efficacy of the proposed method by performing extensive experiments on four samples: four defects in an aluminum plate with different depths, a steel plate with 15-mm coating thickness, one tiny defect on steel and one natural defect. Experimental results have unanimously demonstrated the capabilities of the proposed technique in accurately detecting defects, especially for shallow and coated samples with high resolution.
引用
收藏
页码:923 / 934
页数:12
相关论文
共 43 条
[1]  
Abbasi K, 2008, INT J APPL ELECTROM, V28, P429, DOI 10.3233/JAE-2008-995
[2]   Novel Near-Field Millimeter-Wave Differential Probe Using a Loaded Modulated Aperture [J].
Abou-Khousa, Mohamed A. ;
Kharkovsky, Sergey ;
Zoughi, Reza .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2009, 58 (05) :1273-1282
[3]   Advanced Microwave Imaging [J].
Ahmed, Sherif Sayed ;
Schiessl, Andreas ;
Gumbmann, Frank ;
Tiebout, Marc ;
Methfessel, Sebastian ;
Schmidt, Lorenz-Peter .
IEEE MICROWAVE MAGAZINE, 2012, 13 (06) :26-43
[4]  
[Anonymous], 2012, Microwave Engineering
[5]  
[Anonymous], COMPUT INTELL NEUROS
[6]  
[Anonymous], 2001, IEEE T INSTRUM MEAS, V50, P1197
[7]  
Barbarossa S, 1996, AEU-INT J ELECTRON C, V50, P133
[8]   An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy [J].
Bechou, L ;
Dallet, D ;
Danto, Y ;
Daponte, P ;
Ousten, Y ;
Rapuano, S .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2003, 52 (01) :135-142
[9]   Microwave imaging - Location and shape reconstruction from multifrequency scattering data [J].
Belkebir, K ;
Kleinman, RE ;
Pichot, C .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1997, 45 (04) :469-476
[10]   Crack shape reconstruction in eddy current testing using machine learning systems for regression [J].
Bernieri, Andrea ;
Ferrigno, Luigi ;
Laracca, Marco ;
Molinara, Mario .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (09) :1958-1968