共 17 条
[4]
Generating Burst-error Correcting Codes from Orthogonal Latin Square Codes - a Graph Theoretic Approach
[J].
2011 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT),
2011,
:367-373
[5]
Denes J., 1974, LATIN SQUARES THEIR
[6]
Multiple bit upset tolerant memory using a selective cycle avoidance based SEC-DED-DAEC code
[J].
25TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS,
2007,
:349-+
[7]
Ghosh S., 2007, P FDN NAN FNAN
[10]
Lee SE, 2011, IEEE DES TEST COMPUT, V28, P30, DOI 10.1109/MDT.2011.35