Dielectric characteristics of nanocrystalline Ag-Ba0.5Sr0.5TiO3 composite thin films

被引：21

作者：

Jayadevan, KP ^{[1
]}

Liu, CY

Tseng, TY

机构：

[1] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 300, Taiwan

[2] Natl Chiao Tung Univ, Inst Elect, Hsinchu 300, Taiwan

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 07期

关键词：

D O I：

10.1063/1.1780596

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Nanocrystalline Ag-Ba0.5Sr0.5TiO3 (Ag-BST) composite thin films are deposited on Pt/Ti/SiO2/Si substrates by a sol-gel method. The voltage-dependent capacitance (C-V) and dielectric loss of the films decrease with increasing Ag up to 2 mol % due to a series configuration involving low dielectric interface layers and dense microstructures. The evidence for asymmetric distribution of charge carriers in the Ag-BST film is derived from C-V measurements. The dielectric tunability of BST film with 1 mol % Ag is comparable to that of pure BST. (C) 2004 American Institute of Physics.

引用

页码：1211 / 1213

页数：3

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