Strong ultraviolet emission and rectifying behavior of nanocrystalline ZnO films

被引:51
作者
Zhang, Yang [1 ]
Lin, Bixia [1 ]
Fu, Zhuxi [1 ]
Liu, Cihui [1 ]
Han, Wei [1 ]
机构
[1] Univ Sci & Technol China, Dept Phys, Hefei 230026, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
ZnO films; sol-gel; photoluminescence; rectification;
D O I
10.1016/j.optmat.2005.08.016
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Nanocrystalline ZnO thin films on p-type Si(100) substrates have been prepared by a sol-gel method. X-ray diffraction results showed polycrystalline wurtzite with a preferential (002) orientation. Morphology studies revealed that the films consisted of uniform grains in size of similar to 33 nM. A strong ultraviolet emission with no distinct visible emissions was observed in room temperature photoluminescence spectrum. The ultraviolet emission results from the recombination of free exciton with stronger longitudinal optical (LO) phonon replica. Stronger LO phonon replica may be ascribed to the strong interaction between the exciton and LO phonon in nanostructure. Nanostructure of films is also responsible for the blueshift of free exciton emission compared with single-crystal ZnO. The absence of E, (LO) mode in Raman spectrum further confirmed low defect density in as-grown nanocrystalline ZnO films. The electrical junction properties characterized by current-voltage measurement showed a rectifying behavior. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:1192 / 1196
页数:5
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