We measure the spectrum and efficiency of the infrared light emission from ambipolar carbon nanotube field-effect transistors. The width of the emission peak is strongly device-structure dependent. Long devices (similar to50 mum) show narrow spectral peaks that we attribute to relaxed carrier recombination, while short devices (similar to500 nm) show broad peaks due to hot carrier recombination. The hot carrier distribution is limited to energies below the energies of the optical/zone boundary phonons near 180 meV. The efficiency of the radiative recombination is between 10(-6) and 10(-7) photons/electron-hole pair, and the possible quenching mechanisms are discussed.
机构:
Max Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, GermanyMax Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, Germany
Hagen, A
Hertel, T
论文数: 0引用数: 0
h-index: 0
机构:
Max Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, GermanyMax Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, Germany
机构:
Max Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, GermanyMax Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, Germany
Hagen, A
Hertel, T
论文数: 0引用数: 0
h-index: 0
机构:
Max Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, GermanyMax Planck Gesell, Fritz Haber Inst, Dept Phys Chem, D-14195 Berlin, Germany