Low-field ion microscopy

被引：1
|
作者：
Ksenofontov, V. A. [1 ]
Sadanov, E. V. [1 ]
Velikodnaya, O. A. [1 ]
机构：
[1] Kharkov Physicotech Inst, Natl Res Ctr, Inst Solid State Phys Mat Sci & Technol, UA-61108 Kharkov, Ukraine
来源：
TECHNICAL PHYSICS | 2009年 / 54卷 / 04期
关键词：
TUNGSTEN;
D O I：
10.1134/S1063784209040215
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Experimental data on field ion emission under high partial pressures of water vapor at room temperature are reported. A method for obtaining low-field ion images in the presence of water vapor is proposed and the potentialities, limitations, and prospects of using images in microscopy are considered.
引用
收藏
页码：580 / 585
页数：6
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