Continuous model for independent double gate MOSFET

被引:24
作者
Reyboz, M. [1 ]
Martin, P. [1 ]
Poiroux, T. [1 ]
Rozeau, O. [1 ]
机构
[1] CEA, LETI, MINATEC, F-38054 Grenoble 9, France
关键词
Symmetrical; Asymmetrical and independent double gate; MOSFET; Compact model; Short channel effects; Mobility model; Charge model; SIGNAL CIRCUIT APPLICATIONS; PHYSICAL COMPACT MODEL; THRESHOLD VOLTAGE; DG MOSFET;
D O I
10.1016/j.sse.2009.02.005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes an explicit compact model of an independent double gate (IDG) MOSFET with an undoped channel. This model includes short channel effects and also mobility reduction, saturation velocity, series resistance and a charge model. It is applicable for symmetrical, asymmetrical and independent gate devices. The validity of this model is demonstrated by comparisons with ATLAS two-dimensional numerical simulations. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:504 / 513
页数:10
相关论文
共 31 条
[1]  
[Anonymous], Atlas User's Manual
[2]  
Chan MS, 2004, NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS, P108
[3]   SIMPLE 2-DIMENSIONAL MODEL FOR IGFET OPERATION IN SATURATION REGION [J].
ELMANSY, YA ;
BOOTHROYD, AR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1977, 24 (03) :254-262
[4]  
Frank D. J., 1992, International Electron Devices Meeting 1992. Technical Digest (Cat. No.92CH3211-0), P553, DOI 10.1109/IEDM.1992.307422
[5]  
FREITAS P, 2007, IEEE ICECS
[6]  
GEHRING A, 2004, P IWCE
[7]   Independently driven DG MOSFETs for mixed-signal circuits: Part I - Quasi-static and nonquasi-static channel coupling [J].
Gen, P ;
Kan, ECC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (12) :2086-2093
[8]   Independently driven DG MOSFETs for mixed-signal circuits: Part II - Applications on cross-coupled feedback and harmonics generation [J].
Gen, P ;
Kan, ECC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (12) :2094-2101
[9]  
GIRAUD B, 2008, IEEE ISCAS
[10]   Electrical characterization and modelling of high-performance SON DG MOSFETs [J].
Harrison, S ;
Munteanu, D ;
Autran, JL ;
Cros, A ;
Cerutti, R ;
Skotnicki, T .
ESSDERC 2004: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, 2004, :373-376