Dielectric response and structural properties of TiO2-doped Ba0.6Sr0.4TiO3 films

被引：25

作者：

Jia, QX

Park, BH

Gibbons, BJ

Huang, JY

Lu, P

机构：

[1] Los Alamos Natl Lab, Superconduct Technol Ctr, Los Alamos, NM 87545 USA

[2] New Mexico Tecn, Dept Mat Sci, Socorro, NM 87801 USA

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 01期

关键词：

D O I：

10.1063/1.1491287

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Dielectric Ba0.6Sr0.4TiO3 films doped with different weight percentages of TiO2 were deposited by pulsed-laser deposition. The dielectric constant, dielectric loss, and the dielectric tunability of the films were found to be a strong function of the weight ratio of TiO2/Ba0.6Sr0.4TiO3. Compared to the pure Ba0.6Sr0.4TiO3, the TiO2-doped Ba0.6Sr0.4TiO3 exhibits lower dielectric loss while maintaining a significantly adjustable dielectric constant and desirable capacitance tunability. The change of the dielectric properties of TiO2-doped Ba0.6Sr0.4TiO3 films is closely related to the change in microstructure of the films as revealed by transmission electron microscopy. (C) 2002 American Institute of Physics.

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页码：114 / 116

页数：3

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