Correction of three-fold astigmatism for ultra-high-resolution TEM

被引:12
|
作者
Overwijk, MHF [1 ]
Bleeker, AJ [1 ]
Thust, A [1 ]
机构
[1] PHILIPS ELECTRON OPT,NL-5600 MD EINDHOVEN,NETHERLANDS
关键词
instrumental control and alignment; high resolution transmission electron microscopy (HRTEM);
D O I
10.1016/S0304-3991(96)00096-4
中图分类号
TH742 [显微镜];
学科分类号
摘要
Due to the influence of three-fold astigmatism, the spatial resolution obtained on many modern high-resolution. transmission electron microscopes is often not better than 0.2 nm. Although beam tilt can mask the effect of three-fold astigmatism when imaging periodic specimens, the correction of three-fold astigmatism is required for obtaining isotropic ultra-high resolution (less than or equal to 0.15 nm). Three-fold astigmatism also hampers the correct alignment of the microscope, resulting in additional beam tilt and two-fold astigmatism, and consequently in a further loss of resolution. The amount of three-fold astigmatism of an instrument is found to be stable for periods well in excess of a year. After hardware correction through excitation of a magnetic hexapole in the objective lens stigmator unit of our Philips CM300ST FEG, we reduced the magnitude of the three-fold astigmatism from a value of 1.1 mu m, for this particular instrument, to less than 0.1 mu m, a value at which it allows at least 0.1-nm spatial resolution. Additionally, we show that the microscope can now be properly aligned for ultra-high-resolution experiments using the standard manual alignment procedures.
引用
收藏
页码:163 / 170
页数:8
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