Self-Assembled UV Photodetector Made by Direct Epitaxial GaN Growth on Graphene

被引:54
作者
Journot, Timotee [1 ,2 ]
Bouchiat, Vincent [1 ,3 ]
Gayral, Bruno [1 ,4 ]
Dijon, Jean [1 ,5 ]
Hyot, Berangere [1 ,2 ]
机构
[1] Univ Grenoble Alpes, F-38000 Grenoble, France
[2] CEA, LETI, MINATEC Campus, F-38000 Grenoble, France
[3] CNRS Grenoble, Inst Neel, F-38000 Grenoble, France
[4] CEA, INAC PHELIQS, F-38000 Grenoble, France
[5] CEA, LITEN, MINATEC Campus, F-38000 Grenoble, France
关键词
graphene; gallium nitride; GaN; UV photodetector; MOCVD; QUANTUM DOTS; DEVICES; PHASE; LAYER; TRANSISTOR; FILMS; CVD;
D O I
10.1021/acsami.8b01194
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Hybrid systems based on the combination of crystalline bulk semiconductors with 2D crystals are identified as promising heterogeneous structures for new optoelectronic applications. The direct integration of III-V semiconductors on 2D materials is very attractive to make practical devices but the preservation of the intrinsic properties of the underlying 2D materials remains a challenge. In this work, we study the direct epitaxy of self-organized GaN crystals on graphene. We demonstrate that severe metal-organic chemical vapor deposition growth conditions of GaN (chemically aggressive precursors and high temperatures) are not detrimental to the structural quality and the charge carrier mobility of the graphene base plane. Graphene can therefore be used both as an efficient sensitive material and as a substrate for GaN epitaxy to make a self-assembled UV photodetector. A responsivity as high as 2 A W-1 is measured in the UV-A range without any further postprocessing compared to simple deposition of contact electrodes. Our study opens the way to build new self-assembled 2D/III-V hybrid optoelectronic devices by direct epitaxy.
引用
收藏
页码:18857 / 18862
页数:6
相关论文
共 37 条
  • [1] METALORGANIC VAPOR-PHASE EPITAXIAL-GROWTH OF A HIGH-QUALITY GAN FILM USING AN AIN BUFFER LAYER
    AMANO, H
    SAWAKI, N
    AKASAKI, I
    TOYODA, Y
    [J]. APPLIED PHYSICS LETTERS, 1986, 48 (05) : 353 - 355
  • [2] Identifying suitable substrates for high-quality graphene-based heterostructures
    Banszerus, L.
    Janssen, H.
    Otto, M.
    Epping, A.
    Taniguchi, T.
    Watanabe, K.
    Beschoten, B.
    Neumaier, D.
    Stampfer, C.
    [J]. 2D MATERIALS, 2017, 4 (02):
  • [3] Bonaccorso F, 2010, NAT PHOTONICS, V4, P611, DOI [10.1038/nphoton.2010.186, 10.1038/NPHOTON.2010.186]
  • [4] Random Strain Fluctuations as Dominant Disorder Source for High-Quality On-Substrate Graphene Devices
    Couto, Nuno J. G.
    Costanzo, Davide
    Engels, Stephan
    Ki, Dong-Keun
    Watanabe, Kenji
    Taniguchi, Takashi
    Stampfer, Christoph
    Guinea, Francisco
    Morpurgo, Alberto F.
    [J]. PHYSICAL REVIEW X, 2014, 4 (04):
  • [5] Monitoring dopants by Raman scattering in an electrochemically top-gated graphene transistor
    Das, A.
    Pisana, S.
    Chakraborty, B.
    Piscanec, S.
    Saha, S. K.
    Waghmare, U. V.
    Novoselov, K. S.
    Krishnamurthy, H. R.
    Geim, A. K.
    Ferrari, A. C.
    Sood, A. K.
    [J]. NATURE NANOTECHNOLOGY, 2008, 3 (04) : 210 - 215
  • [6] Dobrovinskaya ER, 2009, MICRO- OPTO-ELECTRON, P55, DOI 10.1007/978-0-387-85695-7_2
  • [7] Raman spectroscopy of electrochemically gated graphene transistors: Geometrical capacitance, electron-phonon, electron-electron, and electron-defect scattering
    Froehlicher, Guillaume
    Berciaud, Stephane
    [J]. PHYSICAL REVIEW B, 2015, 91 (20)
  • [8] Furchi MM, 2014, NANO LETT, V14, P6165, DOI [10.1021/nl502339q, 10.1021/n1502339q]
  • [9] Metal organic vapour phase epitaxy of GaN and lateral overgrowth
    Gibart, P
    [J]. REPORTS ON PROGRESS IN PHYSICS, 2004, 67 (05) : 667 - 715
  • [10] Black Phosphorus Mid-Infrared Photodetectors with High Gain
    Guo, Qiushi
    Pospischil, Andreas
    Bhuiyan, Maruf
    Jiang, Hao
    Tian, He
    Farmer, Damon
    Deng, Bingchen
    Li, Cheng
    Han, Shu-Jen
    Wang, Han
    Xia, Qiangfei
    Ma, Tso-Ping
    Mueller, Thomas
    Xia, Fengnian
    [J]. NANO LETTERS, 2016, 16 (07) : 4648 - 4655