Characterization of sol gel Zn1-xCaxO thin layers deposited on p-Si substrate by spin-coating method

被引:6
作者
Fouzri, Afif [1 ,2 ]
Althumairi, Nouf Ahmed [1 ,2 ,3 ]
Sallet, Vincent [4 ]
Lusson, Alain [4 ]
机构
[1] Imam Abdulrahman Bin Faisal Univ, Dept Phys, Coll Sci, POB 1982, Dammam 31441, Saudi Arabia
[2] Imam Abdulrahman Bin Faisal Univ, Basic & Appl Sci Res Ctr, POB 1982, Dammam 31441, Saudi Arabia
[3] Majmaah Univ, Dept Biol, Coll Educ, POB 66, Almajmaah 11952, Saudi Arabia
[4] Univ Versailles St Quentin en Yvelines, Univ Paris Saclay, CNRS, Grp Etud Matiere Condensee GEMAC, 45 Ave Etats Unis, F-78035 Versailles, France
关键词
Zn1-xCaxO; Sol gel; Spin coating; X-ray and optical properties; DOPED ZNO NANOPARTICLES; OPTICAL-PROPERTIES; BAND-GAP; PHOTOCATALYTIC ACTIVITY; ELECTRICAL-PROPERTIES; FILMS; GROWTH; LUMINESCENCE; ENHANCEMENT; FABRICATION;
D O I
10.1016/j.optmat.2020.110519
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films Zn1-xCaxO (0 <= x <= 6%) on a p-Si substrate are elaborated by sol-gel process and spin coating. X-ray diffraction displays a hexagonal wurtzite structure with an increase of lattice parameters confirming the substitution of Zn2+ by Ca2+. The estimation of crystallite sizes along the three main crystallographic planes is practically constant (22 nm) suggesting a spherical symmetry shape of the crystallites which is confirmed by SEM. UV-visible reflectance spectra attest a band gap tuning from 3.144 to 3.262 eV which is confirmed by the PL measurement at 2 K for Zn0.94Ca0.06O sample by the appearance of a broad band around 3.508 eV. Although the luminescence of the samples is weak, we well distinguish the free exciton emission (FXA) positioned at 3.376 eV and the bound exciton recombination ((DX)-X-0) around 3.362 eV.
引用
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页数:11
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