X-ray diffraction topography investigation of the core in Bi12SiO20 crystals

被引：7

作者：

Milenov, TI ^{[1
]}

Rafailov, PM ^{[1
]}

Botev, PA ^{[1
]}

Gospodinov, MM ^{[1
]}

机构：

[1] Bulgarian Acad Sci, Inst Solid State Phys, BU-1784 Sofia, Bulgaria

来源：

MATERIALS RESEARCH BULLETIN | 2002年 / 37卷 / 09期

关键词：

oxides; X-ray diffraction; defects;

D O I：

10.1016/S0025-5408(02)00816-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The core in a large Bi12SiO20 crystal as well as the regions free of optical inhomogenities was examined by X-ray double-crystal diffraction topography. It was established that the observed defects in the central core are two-dimensional. The absorption of some impurities as well as the composition changes observed in this area by other authors, should be considered as a consequence of the formation of these defects. (C) 2002 Elsevier Science Ltd. All rights reserved.

引用

页码：1651 / 1658

页数：8

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