Circuit Reliability Analysis Using Signal Reliability Correlations

被引：6

作者：

Cai, Jinchen ^{[1
]}

Chen, Chunhong ^{[1
]}

机构：

[1] Univ Windsor, Dept Elect & Comp Engn, Windsor, ON, Canada

来源：

2017 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY COMPANION (QRS-C) | 2017年

关键词：

Combinational circuits; reliability analysis; signal probability correlation; signal reliability correlation; large-scale circuits; LOGIC-CIRCUITS; DESIGN;

D O I：

10.1109/QRS-C.2017.34

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

With continuous scaling of CMOS technology, reliability is becoming one of key issues for integrated circuit designs. This paper presents an effective reliability analysis method for combinational circuits by using signal reliability correlations. Signal probabilities in the error-free version of unreliable circuits are assumed to be available prior to using the proposed method, as they can be obtained from many standard CAD tools. Simulation results on benchmark circuits show that the proposed method outperforms many existing methods in terms of efficiency and/or accuracy levels.

引用

页码：171 / 176

页数：6

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