Plasma-assisted MBE growth and characterization of InN on sapphire

被引:52
作者
Ivanov, SV
Shubina, TV
Jmerik, VN
Vekshin, VA
Kop'ev, PS
Monemar, B
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden
关键词
growth models; morphological stability; optical spectroscopy; molecular beam epitaxy; InN; semiconducting indium compounds;
D O I
10.1016/j.jcrysgro.2004.05.027
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We report on a close correlation between the growth conditions of InN/Al2O3 (0 0 0 1) epilayers grown by plasma-assisted molecular beam epitaxy (MBE); their optical properties in the IR range, and the In clustering in the layers. High-spatial resolution techniques, namely micro-cathodoluminesesence, back-scattered electron imaging and energy dispersive X-ray analysis, were used to establish this correlation. The In-rich growth conditions, achieved by increasing either the growth temperature or the effective In/N flux ratio, causes the In clustering in InN, responsible in our samples for the 0.7-0.8 eV luminescence and IR optical absorption. Growth under In/N = 1: 1 conditions slightly shifted to the N-rich side generally produces InN layers without visible In clusters, having an optical absorption edge around 1.4 eV. A possible mechanism of In cluster formation is suggested on the basis of thermodynamic considerations for InN MBE growth. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 9
页数:9
相关论文
共 27 条
[1]   Indium nitride (InN): A review on growth, characterization, and properties [J].
Bhuiyan, AG ;
Hashimoto, A ;
Yamamoto, A .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (05) :2779-2808
[2]   Surface kinetics of zinc-blende (001)GaN [J].
Brandt, O ;
Yang, H ;
Ploog, KH .
PHYSICAL REVIEW B, 1996, 54 (07) :4432-4435
[3]  
CHEN WL, 2000, J NITRIDE SEMICOND R
[4]  
Davydov VY, 2002, PHYS STATUS SOLIDI B, V229, pR1, DOI 10.1002/1521-3951(200202)229:3<R1::AID-PSSB99991>3.0.CO
[5]  
2-O
[6]   Control of GaN surface morphologies using plasma-assisted molecular beam epitaxy [J].
Heying, B ;
Averbeck, R ;
Chen, LF ;
Haus, E ;
Riechert, H ;
Speck, JS .
JOURNAL OF APPLIED PHYSICS, 2000, 88 (04) :1855-1860
[7]   Physical properties of InN with the band gap energy of 1.1eV [J].
Inushima, T ;
Mamutin, VV ;
Vekshin, VA ;
Ivanov, SV ;
Sakon, T ;
Motokawa, M ;
Ohoya, S .
JOURNAL OF CRYSTAL GROWTH, 2001, 227 :481-485
[8]  
Ivanov SV, 2002, VACUUM SCIENCE AND TECHNOLOGY: NITRIDES AS SEEN BY THE TECHNOLOGY 2002, P369
[9]   Growth of optically-active InN with AlInN buffer by plasma-assisted molecular beam epitaxy [J].
Jmerik, VN ;
Vekshin, VA ;
Shubina, TV ;
Ratnikov, VV ;
Ivanov, SV ;
Monemar, B .
5TH INTERNATIONAL CONFERENCE ON NITRIDE SEMICONDUCTORS (ICNS-5), PROCEEDINGS, 2003, 0 (07) :2846-2850
[10]  
Kreibig U., 1995, OPTICAL PROPERTIES M