Measurement of thermal conductivity and thermal diffusivity using a thermoelectric module

被引:8
作者
Beltran-Pitarch, Braulio [1 ]
Marquez-Garcia, Lourdes [1 ,2 ]
Min, Gao [2 ]
Garcia-Canadas, Jorge [1 ]
机构
[1] Univ Jaume 1, Dept Ind Syst Engn & Design, Campus Riu Sec, Castellon de La Plana 12071, Spain
[2] Cardiff Univ, Cardiff Sch Engn, Cardiff CF24 3AA, S Glam, Wales
关键词
Peltier device; ac impedance; screening; high throughput; thermal properties;
D O I
10.1088/1361-6501/aa5c30
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A proof of concept of using a thermoelectric module to measure both thermal conductivity and thermal diffusivity of bulk disc samples at room temperature is demonstrated. The method involves the calculation of the integral area from an impedance spectrum, which empirically correlates with the thermal properties of the sample through an exponential relationship. This relationship was obtained employing different reference materials. The impedance spectroscopy measurements are performed in a very simple setup, comprising a thermoelectric module, which is soldered at its bottom side to a Cu block (heat sink) and thermally connected with the sample at its top side employing thermal grease. Random and systematic errors of the method were calculated for the thermal conductivity (18.6% and 10.9%, respectively) and thermal diffusivity (14.2% and 14.7%, respectively) employing a BCR724 standard reference material. Although errors are somewhat high, the technique could be useful for screening purposes or high-throughput measurements at its current state. This new method establishes a new application for thermoelectric modules as thermal properties sensors. It involves the use of a very simple setup in conjunction with a frequency response analyzer, which provides a low cost alternative to most of currently available apparatus in the market. In addition, impedance analyzers are reliable and widely spread equipment, which facilities the sometimes difficult access to thermal conductivity facilities.
引用
收藏
页数:6
相关论文
共 8 条
[1]   Historical Evolution of the Transient Hot-Wire Technique [J].
Assael, Marc J. ;
Antoniadis, Konstantinos D. ;
Wakeham, William A. .
INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2010, 31 (06) :1051-1072
[2]  
BIPM, 1995, EV MEAS DAT GUM GUID
[3]   The Peltier driven frequency domain approach in thermal analysis [J].
De Marchi, Andrea ;
Giaretto, Valter .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (10)
[4]   Impedance spectroscopy models for the complete characterization of thermoelectric materials [J].
Garcia-Canadas, Jorge ;
Min, Gao .
JOURNAL OF APPLIED PHYSICS, 2014, 116 (17)
[5]   Thermal dynamics of thermoelectric phenomena from frequency resolved methods [J].
Garcia-Canadasa, J. ;
Min, G. .
AIP ADVANCES, 2016, 6 (03)
[6]   Thermomechanical and viscoelastic behavior of a no-flow underfill material for flip-chip applications [J].
He, Y .
THERMOCHIMICA ACTA, 2005, 439 (1-2) :127-134
[7]   FLASH METHOD OF DETERMINING THERMAL DIFFUSIVITY, HEAT CAPACITY, AND THERMAL CONDUCTIVITY [J].
PARKER, WJ ;
JENKINS, RJ ;
ABBOTT, GL ;
BUTLER, CP .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (09) :1679-&
[8]   Thermal conductivity of insulations using guarded hot plates, including recent developments and sources of reference materials [J].
Salmon, D .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (12) :R89-R98