Energy transfer between eigenmodes in multimodal atomic force microscopy
被引:27
作者:
An, Sangmin
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机构:
NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
Univ Maryland, Maryland NanoCtr, College Pk, MD 20742 USANIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
An, Sangmin
[1
,2
]
Solares, Santiago D.
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机构:
NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
Univ Maryland, Maryland NanoCtr, College Pk, MD 20742 USA
Univ Maryland, Dept Mech Engn, College Pk, MD 20742 USANIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
Solares, Santiago D.
[1
,2
,3
]
Santos, Sergio
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机构:
Masdar Inst Sci & Technol, Inst Ctr Future Energy iFES, Lab Energy & Nanosci LENS, Abu Dhabi, U Arab EmiratesNIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA
multifrequency atomic force microscopy;
energy transfer;
dissipation;
virial;
polymers;
SOFT MATTER;
PHASE-CONTRAST;
MODE;
DISSIPATION;
SURFACES;
LIQUID;
D O I:
10.1088/0957-4484/25/47/475701
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
We present experimental and computational investigations of tetramodal and pentamodal atomic force microscopy (AFM), respectively, whereby the first four or five flexural eigenmodes of the cantilever are simultaneously excited externally. This leads to six to eight additional observables in the form of amplitude and phase signals, with respect to the monomodal amplitude modulation method. We convert these additional observables into three or four dissipation and virial expressions, and show that these quantities can provide enhanced contrast that would otherwise remain hidden in the original observables. We also show that the complexity of the multimodal impact leads to significant energy transfer between the active eigenmodes, such that the dissipated power for individual eigenmodes may be positive or negative, while the total dissipated power remains positive. These results suggest that the contrast of individual eigenmodes in multifrequency AFM should be not be considered in isolation and that it may be possible to use different eigenfrequencies to probe sample properties that respond to different relaxation times.
机构:
KTH Royal Inst Technol, SE-10691 Stockholm, Sweden
KTH Royal Inst Technol, Nordita, SE-10691 Stockholm, Sweden
Stockholm Univ, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Borysov, Stanislav S.
;
Platz, Daniel
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机构:
KTH Royal Inst Technol, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Platz, Daniel
;
de Wijn, Astrid S.
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机构:
Stockholm Univ, Dept Phys, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
de Wijn, Astrid S.
;
Forchheimer, Daniel
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机构:
KTH Royal Inst Technol, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Forchheimer, Daniel
;
Tolen, Eric A.
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h-index: 0
机构:
Intermodulat Prod AB, SE-16958 Solna, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Tolen, Eric A.
;
Balatsky, Alexander V.
论文数: 0引用数: 0
h-index: 0
机构:
KTH Royal Inst Technol, Nordita, SE-10691 Stockholm, Sweden
Stockholm Univ, SE-10691 Stockholm, Sweden
Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
Los Alamos Natl Lab, Ctr Integrated Nanotechnol, Los Alamos, NM 87545 USAKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Balatsky, Alexander V.
;
Haviland, David B.
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h-index: 0
机构:
KTH Royal Inst Technol, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
机构:
KTH Royal Inst Technol, SE-10691 Stockholm, Sweden
KTH Royal Inst Technol, Nordita, SE-10691 Stockholm, Sweden
Stockholm Univ, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Borysov, Stanislav S.
;
Platz, Daniel
论文数: 0引用数: 0
h-index: 0
机构:
KTH Royal Inst Technol, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Platz, Daniel
;
de Wijn, Astrid S.
论文数: 0引用数: 0
h-index: 0
机构:
Stockholm Univ, Dept Phys, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
de Wijn, Astrid S.
;
Forchheimer, Daniel
论文数: 0引用数: 0
h-index: 0
机构:
KTH Royal Inst Technol, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Forchheimer, Daniel
;
Tolen, Eric A.
论文数: 0引用数: 0
h-index: 0
机构:
Intermodulat Prod AB, SE-16958 Solna, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Tolen, Eric A.
;
Balatsky, Alexander V.
论文数: 0引用数: 0
h-index: 0
机构:
KTH Royal Inst Technol, Nordita, SE-10691 Stockholm, Sweden
Stockholm Univ, SE-10691 Stockholm, Sweden
Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
Los Alamos Natl Lab, Ctr Integrated Nanotechnol, Los Alamos, NM 87545 USAKTH Royal Inst Technol, SE-10691 Stockholm, Sweden
Balatsky, Alexander V.
;
Haviland, David B.
论文数: 0引用数: 0
h-index: 0
机构:
KTH Royal Inst Technol, SE-10691 Stockholm, SwedenKTH Royal Inst Technol, SE-10691 Stockholm, Sweden