High Crystalline Dithienosilole-Cored Small Molecule Semiconductor for Ambipolar Transistor and Nonvolatile Memory

被引:32
作者
Kang, Woonggi [1 ]
Jung, Minwoo [2 ,3 ]
Cha, Wonsuk [4 ]
Jang, Sukjae [1 ]
Yoon, Youngwoon [2 ]
Kim, Hyunjung [4 ]
Son, Hae Jung [2 ]
Lee, Doh-Kwon [2 ]
Kim, BongSoo [2 ]
Cho, Jeong Ho [1 ]
机构
[1] Sungkyunkwan Univ, SKKU Adv Inst Nanotechnol SAINT, Sch Chem Engn, Suwon 440746, South Korea
[2] Korea Inst Sci & Technol, Photoelect Hybrids Res Ctr, Seoul 136791, South Korea
[3] Korea Univ, Dept Chem, Seoul 136713, South Korea
[4] Sogang Univ, Dept Phys, Seoul 121742, South Korea
基金
新加坡国家研究基金会;
关键词
donor-acceptor-type small molecules; ambipolar field effect transistor; nonvolatile memory; crystallinity; hole mobility; charge trapping; FIELD-EFFECT TRANSISTORS; THIN-FILM TRANSISTORS; HIGH-PERFORMANCE; MATERIALS DESIGN; N-CHANNEL; POLYMER; ELECTRON; HOLE; SUBSTITUTION; MOBILITIES;
D O I
10.1021/am500080p
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We characterized the electrical properties of a field-effect transistor (FET) and a nonvolatile memory device based on a solution-processable low bandgap small molecule, Si1TDPP-EE-C6. The small molecule consisted of electron-rich thiophene-dithienosilole-thiophene (Si1T) units and electron-deficient diketopyrrolopyrrole (DPP) units. The as-spun Si1TDPP-EE-C6 FET device exhibited ambipolar transport properties with a hole mobility of 7.3 X 10(-5) cm(2)/(V s) and an electron mobility of 1.6 X 10(-5) cm(2) /(V s). Thermal annealing at 110 degrees C led to a significant increase in carrier mobility, with hole and electron mobilities of 3.7 X 10(-3) and 5.1 X 10(-4) cm(2)/(Vs), respectively. This improvement is strongly correlated with the increased film crystallinity and reduced pi-pi intermolecular stacking distance upon thermal annealing, revealed by grazing incidence X-ray diffraction (GIXD) and atomic force microscopy (AFM) measurements. In addition, nonvolatile memory devices based on Si1TDPP-EE-C6 were successfully fabricated by incorporating Au nanoparticles (AuNPs) as charge trapping sites at the interface between the silicon oxide (SiO2) and cross-linked poly(4-vinylphenol) (cPVP) dielectrics. The device exhibited reliable nonvolatile memory characteristics, including a wide memory window of 98 V, a high on/off-current ratio of 1 X 10(3), and good electrical reliability. Overall, we demonstrate that donor-acceptor-type small molecules are a potentially important class of materials for ambipolar FETs and nonvolatile memory applications.
引用
收藏
页码:6589 / 6597
页数:9
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