Temperature-resistance sensor arrays for combinatorial study of phase transitions in shape memory alloys and metallic glasses

被引：6

作者：

Zheng, Juanjuan ^{[1
,2
]}

Zhang, Haitao ^{[1
]}

Miao, Yucong ^{[1
]}

Chen, Shi ^{[2
]}

Vlassak, Joost J. ^{[1
]}

机构：

[1] Harvard Univ, John A Paulson Sch Engn & Appl Sci, Cambridge, MA 02138 USA

[2] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan 430074, Hubei, Peoples R China

来源：

SCRIPTA MATERIALIA | 2019年 / 168卷

基金：

美国国家科学基金会;

关键词：

Resistance-temperature sensor; High-throughput characterization; Shape memory alloy; Metallic glass; Glass forming ability; TRANSFORMATIONS;

D O I：

10.1016/j.scriptamat.2019.04.027

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We have developed sensor arrays using a simple and inexpensive fabrication process to measure the electrical resistance of thin-film materials as a function of temperature and composition. The sensors are capable of characterizing materials from liquid-nitrogen temperature to approximately 900 K and are not limited by low sample conductivity. We demonstrate the sensitivity and accuracy of the technique by analyzing the phase evolution in Ti-Ni-Cu shape memory alloys and PdSi-based metallic glasses. For the latter, we find that the change in resistance on crystallization correlates with glass-forming ability. This observation may be useful in identifying good glass formers using high-throughput techniques. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：144 / 148

页数：5

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