Loss mechanisms in superconducting thin film microwave resonators

被引:48
作者
Goetz, Jan [1 ,2 ]
Deppe, Frank [1 ,2 ,3 ]
Haeberlein, Max [1 ,2 ]
Wulschner, Friedrich [1 ,2 ]
Zollitsch, Christoph W. [1 ,2 ]
Meier, Sebastian [1 ,2 ]
Fischer, Michael [1 ,2 ]
Eder, Peter [1 ,2 ,3 ]
Xie, Edwar [1 ,2 ,3 ]
Fedorov, Kirill G. [1 ,2 ]
Menzel, Edwin P. [1 ,2 ]
Marx, Achim [1 ]
Gross, Rudolf [1 ,2 ,3 ]
机构
[1] Bayer Akademie Wissensch, Walther Meissner Inst, D-85748 Garching, Germany
[2] Tech Univ Munich, Dept Phys, D-85748 Garching, Germany
[3] Nanosyst Initiat Munich, D-80799 Munich, Germany
关键词
CIRCUIT QUANTUM ELECTRODYNAMICS; ELECTRICAL-RESISTIVITY; TUNNEL-JUNCTIONS; CONDUCTIVITY; DEPENDENCE; SYSTEMS; COPPER;
D O I
10.1063/1.4939299
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a systematic analysis of the internal losses of superconducting coplanar waveguide microwave resonators based on niobium thin films on silicon substrates. In particular, we investigate losses introduced by Nb/A1 interfaces in the center conductor, which is important for experiments where A1 based Josephson junctions are integrated into Nb based circuits. We find that these interfaces can be a strong source for two-level state (TLS) losses, when the interfaces are not positioned at current nodes of the resonator. In addition to TLS losses, for resonators including A1, quasiparticle losses become relevant above 200 mK. Finally, we investigate how losses generated by eddy currents in conductive material on the backside of the substrate can be minimized by using thick enough substrates or metals with high conductivity on the substrate backside. (c) 2016 AIP Publishing LLC.
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页数:8
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