High-accuracy displacement metrology and control using a dual Fabry-Perot cavity with an optical frequency comb generator

被引:21
作者
Bitou, Youichi [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058563, Japan
来源
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2009年 / 33卷 / 02期
关键词
Displacement; Optical frequency comb; Fabry-Perot cavity; Sub-nm; Uncertainty; TUNABLE DIODE-LASER; INTERFEROMETER; CALIBRATION; NONLINEARITY; RESOLUTION; SCALES; AIR;
D O I
10.1016/j.precisioneng.2008.05.004
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A displacement metrology and control system using an optical frequency comb generator and a dual Fabry-Perot cavity is developed with sub-nm accuracy. The optical frequency comb generator has expanded the displacement measurement range and the dual cavity system has suppressed the environmental fluctuation. We evaluated the absolute uncertainty of the developed displacement measurement system to be approximately 190 pm for the displacement of 14 mu m and the accurate displacement control using a phase-locked loop was demonstrated with a resolution of approximately 24 pm. (C) 2008 Elsevier Inc. All rights reserved.
引用
收藏
页码:187 / 193
页数:7
相关论文
共 20 条
[11]   Michelson interferometry with 10 pm accuracy [J].
Lawall, J ;
Kessler, E .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (07) :2669-2676
[12]   Fabry-Perot metrology for displacements up to 50 mm [J].
Lawall, JR .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2005, 22 (12) :2786-2798
[13]   Coherent range-gated laser displacement metrology with compact optical head [J].
Lay, O. P. ;
Dubovitsky, S. ;
Shaddock, D. A. ;
Ware, B. .
OPTICS LETTERS, 2007, 32 (20) :2933-2935
[14]   Sub-hundred nanometre pitch measurements using an AFM with differential laser interferometers for designing usable lateral scales [J].
Misumi, I ;
Gonda, S ;
Huang, QX ;
Keem, T ;
Kurosawa, T ;
Fujii, A ;
Hisata, N ;
Yamagishi, T ;
Fujimoto, H ;
Enjoji, K ;
Aya, S ;
Sumitani, H .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2005, 16 (10) :2080-2090
[15]   CALIBRATION OF THE ELECTRICAL RESPONSE OF PIEZOELECTRIC ELEMENTS AT LOW-VOLTAGE USING LASER INTERFEROMETRY [J].
RIIS, E ;
SIMONSEN, H ;
WORM, T ;
NIELSEN, U ;
BESENBACHER, F .
APPLIED PHYSICS LETTERS, 1989, 54 (25) :2530-2531
[16]   A new vacuum interferometric comparator for calibrating the fine linear encoders and scales [J].
Sawabe, M ;
Maeda, F ;
Yamaryo, Y ;
Simomura, T ;
Saruki, Y ;
Kubo, T ;
Sakai, H ;
Aoyagi, S .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2004, 28 (03) :320-328
[17]   Displacement metrology with sub-pm resolution in air based on a fs-comb wavelength synthesizer [J].
Schibli, TR ;
Minoshima, K ;
Bitou, Y ;
Hong, FL ;
Inaba, H ;
Onae, A ;
Matsumoto, H .
OPTICS EXPRESS, 2006, 14 (13) :5984-5993
[18]   Atomic-resolution measurements with a new tunable diode laser-based interferometer [J].
Silver, RM ;
Zou, H ;
Gonda, S ;
Damazo, B ;
Jun, J ;
Jensen, C ;
Howard, L .
OPTICAL ENGINEERING, 2004, 43 (01) :79-86
[19]   Nonlinearity in measurements of length by optical interferometry [J].
Wu, CM ;
Su, CS .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1996, 7 (01) :62-68
[20]   Accurate frequency atlas of molecular iodine near 532 nm measured by an optical frequency comb generator [J].
Zhang, Y ;
Ishikawa, J ;
Hong, FL .
OPTICS COMMUNICATIONS, 2001, 200 (1-6) :209-215