Homoepitaxial diamond films grown by step-flow mode in various misorientation angles of diamond substrates

被引:54
作者
Takeuchi, D
Watanabe, H
Yamanaka, S
Okushi, H
Kajimura, K
机构
[1] Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan
[2] Univ Tsukuba, Inst Mat Sci, Tsukuba, Ibaraki 3058573, Japan
关键词
homoepitaxy; low methane concentration; misorientation angle; morphology;
D O I
10.1016/S0925-9635(99)00332-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface morphologies of device-grade homoepitaxial diamond films grown by microwave plasma chemical vapor deposition (CVD) with CH4/H-2 ratios and misorientation angles of diamond (001) substrates are discussed. We produced a map of surface morphologies as a function of both the misorientation angles of the diamond substrates and CH4/H-2 ratios. This map revealed that homoepitaxy under CH4/H-2 ratios greater than 0.05% was in good agreement with results reported in the literature. This could be explained in terms of migration length and CH4/H-2 ratios. On the other hand, when the CH4/H-2 ratios were lower than 0.15%, we found that the misorientation angle does not affect the surface morphology of the homoepitaxial diamond films so much, and we obtained atomically flat surfaces over the whole substrate area. The numerical result may be consistent with the fact that the migration length of precursors increases by orders of magnitude in the presence of a large amount of atomic hydrogen. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:231 / 235
页数:5
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