Truncated Gaussian noise in ADC histogram tests

被引:14
作者
Bjorsell, Niclas [1 ]
Handel, Peter
机构
[1] Univ Gavle, ITB Elect, SE-80176 Gavle, Sweden
[2] Royal Inst Technol, Signal Proc Lab, SE-10044 Stockholm, Sweden
关键词
ADC; histogram tests; CRLB; MVE; testing; signal processing;
D O I
10.1016/j.measurement.2006.05.005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
One method to characterize analogue to digital converters (ADCs) is to use a histogram, where Gaussian noise may be used as stimulus signal. However, a Gaussian noise signal that excites all transition levels also generates input values outside working range of the ADC. Modern signal generators can generate arbitrary signals. Hence, excluding undesired values outside the ADC full scale can minimize test sequences. Truncating the signal to the working range gives further advantages, which are explored in this paper. The Cramer-Rao lower bound and a minimum variance estimator for histogram tests with an arbitrary stimulus are derived. These are applied for truncated Gaussian noise and the result is theoretically evaluated and compared to untruncated noise. It is shown that accuracy increases for a fixed sample length and that variation over transition levels decrease. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:36 / 42
页数:7
相关论文
共 10 条
[1]  
Bjorsell N, 2005, P ADDA05 LIM
[2]  
BJORSELL N, 2004, P WORKSH ADC MOD TES
[3]  
IEEE, 2000, IEEE Std 1241-2000
[4]  
Kay SM, 1993, Fundamentals of Statistical Signal Processing
[5]  
Linnenbrink TE, 2006, IEEE INSTRU MEAS MAG, V9, P39
[6]   Automated ADC characterization using the histogram test stimulated by Gaussian noise [J].
Martins, RC ;
Serra, AMD .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (02) :471-474
[7]  
MARTINS RC, 1998, P IEEE INT C EL CIRC, P457
[8]  
MOSHITTA A, 2003, P INT WORKSH ADC MOD, P213
[9]  
Rapuano S, 2005, IEEE INSTRU MEAS MAG, V8, P44, DOI 10.1109/MIM.2005.1578617
[10]  
Wigren T., 1996, P ICASSP, P2952