Digital Module 08: Foundations of Operational Item Analysis

被引：0

作者：

Yoo, Hanwook ^{[1
]}

Hambleton, Ronald K. ^{[2
]}

机构：

[1] Educ Testing Serv, Psychometr Anal & Res Div, Princeton, NJ 08541 USA

[2] Univ Massachusetts, Ctr Educ Assessment, Amherst, MA 01003 USA

来源：

EDUCATIONAL MEASUREMENT-ISSUES AND PRACTICE | 2019年 / 38卷 / 03期

关键词：

classical test theory; difficulty; discrimination; distractors; item analysis; item response theory; R Shiny; TAP; test development;

D O I：

10.1111/emip.12289

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

Item analysis is an integral part of operational test development and is typically conducted within two popular statistical frameworks: classical test theory (CTT) and item response theory (IRT). In this digital ITEMS module, Hanwook Yoo and Ronald K. Hambleton provide an accessible overview of operational item analysis approaches within these frameworks. They review the different stages of test development and associated item analyses to identify poorly performing items and effective item selection. Moreover, they walk through the computational and interpretational steps for CTT- and IRT-based evaluation statistics using simulated data examples and review various graphical displays such as distractor response curves, item characteristic curves, and item information curves. The digital module contains sample data, Excel sheets with various templates and examples, diagnostic quiz questions, data-based activities, curated resources, and a glossary.

引用

页码：116 / 117

页数：2