A 0.18 μm dual-gate CMOS model for the design of 2.4 GHz low noise amplifier

被引:0
作者
Liang, Kung-Hao [1 ]
Chan, Yi-Jen [1 ]
机构
[1] Natl Cent Univ, Dept Elect Engn, Chungli 32054, Taiwan
来源
2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS | 2006年
关键词
dual-gate; CMOS; BSIM; low-noise amplifier;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A dual-gate TSNIC 0.18 mu m gate-length n-MOS has been measured and characterized. The modified dual-gate large-signal model consists of two intrinsic, single-gate conventional BSIM3v3 nonlinear models and the passive network is proposed representing the device parasitic effects. This large-signal rf model includes the required passive components to fit the device dc and rf characteristics. The extrinsic elements of capacitance and inductance are calculated from the three-port S-parameters. Good agreement has been obtained between the simulation results of the equivalent circuit model and the measured data up to 15 GHz. In order to verify this modified model, a 2.4 GHz dual-gate low noise amplifier was designed based on this modified model. The LNA measurement results are consistent with the simulations, which demonstrate that the cascode-type dual-gate CMOS model can be applied for microwave circuit design.
引用
收藏
页码:353 / +
页数:2
相关论文
共 8 条
[1]   Noise optimization of an inductively degenerated CMOS low noise amplifier [J].
Andreani, P ;
Sjöland, H .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 2001, 48 (09) :835-841
[2]  
Deng WK, 1998, IEEE MTT S INT MICR, P157, DOI 10.1109/MWSYM.1998.689346
[3]   A 7-GHz 1.8-dB NFCMOS low-noise amplifier [J].
Fujimoto, R ;
Kojima, K ;
Otaka, S .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2002, 37 (07) :852-856
[4]   Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz [J].
Jen, SHM ;
Enz, CC ;
Pehlke, DR ;
Schröter, M ;
Sheu, BJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (11) :2217-2227
[5]   Scaleable large-signal model of 0.18 μm CMOS process for rf power predictions [J].
Kuo, CW ;
Hsiao, CC ;
Ho, CC ;
Chan, YJ .
SOLID-STATE ELECTRONICS, 2003, 47 (01) :77-81
[6]  
PAN JJ, 1981, IEEE MTT S INT MICR, P434
[7]   A NOVEL, BIAS-DEPENDENT, SMALL-SIGNAL MODEL OF THE DUAL-GATE MESFET [J].
SCHOON, M .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1994, 42 (02) :212-216
[8]  
Tsironis C., 1980, Acta Electronica, V23, P317