Simulation of charge collection and sharing in microstrip detectors

被引：16

作者：

Brodbeck, TJ

Chilingarov, A

机构：

[1] Budker Institute for Nuclear Physics, Novosibirsk

[2] School of Physics and Chemistry, University of Lancaster

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1997年 / 395卷 / 01期

关键词：

D O I：

10.1016/S0168-9002(97)00636-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The various mechanisms which can cause broadening of the signal distribution in a microstrip detector are discussed, in turn, via a simple simulation. Some analytic results for calculating the effect of dead areas are also presented. A comparison is made of GaAs test beam data with the results of the simulation.

引用

页码：29 / 34

页数：6