MOMBE selective infill growth of InP/GaInAs for quantum dot formation

被引:2
|
作者
Gibis, R
Schelhase, S
Steingrüber, R
Urmann, G
Künzel, H
Thiel, S
Stier, O
Bimberg, D
机构
[1] Heinrich Hertz Inst Nachrichtentech Berlin GmbH, D-10587 Berlin, Germany
[2] Tech Univ Berlin, Inst Festkorperphys, D-10623 Berlin, Germany
关键词
MOMBE; selective infill growth; e-beam lithography; quantum dot;
D O I
10.1016/S0022-0248(99)00605-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Quantum dots based on InP/GaInAs quantum wells were realised using epitaxial infill regrowth into a hole array formed in InP by means of e-beam lithography and reactive ion etching. Metal organic molecular beam epitaxy has been applied for selective infill growth. The growth procedure has been elaborated such that the vertical growth rate in predefined holes agrees with coherent growth and edge effects are minimised. Quantum dots formed in holes with a diameter ranging from 60 nm down to 30 nm in combination with a periodicity of 100 nm were studied. The achievement of quantum dots was evidenced by a blue shift of light emission with decreasing the geometrical quantum dot diameter, in qualitative agreement with calculations. Quantitative discrepancies were found because the effective lateral diameter of the quantum dots proved to be smaller than the geometrical value of the etched holes, caused by the lateral growth of the lower InP barrier. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:499 / 503
页数:5
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