X-ray microprobe of orbital alignment in strong-field ionized atoms

被引:76
作者
Young, L. [1 ]
Arms, D. A. [1 ]
Dufresne, E. M. [1 ]
Dunford, R. W. [1 ]
Ederer, D. L. [1 ]
Hohr, C. [1 ]
Kanter, E. P. [1 ]
Krassig, B. [1 ]
Landahl, E. C. [1 ]
Peterson, E. R. [1 ]
Rudati, J. [1 ]
Santra, R. [1 ]
Southworth, S. H. [1 ]
机构
[1] Argonne Natl Lab, Argonne, IL 60439 USA
关键词
D O I
10.1103/PhysRevLett.97.083601
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have developed a synchrotron-based, time-resolved x-ray microprobe to investigate optical strong-field processes at intermediate intensities (10(14)-10(15) W/cm(2)). This quantum-state specific probe has enabled the direct observation of orbital alignment in the residual ion produced by strong-field ionization of krypton atoms via resonant, polarized x-ray absorption. We found strong alignment to persist for a period long compared to the spin-orbit coupling time scale (6.2 fs). The observed degree of alignment can be explained by models that incorporate spin-orbit coupling. The methodology is applicable to a wide range of problems.
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页数:4
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