Diagnostics of chlorine inductively coupled plasmas. Measurement of electron temperatures and electron energy distribution functions

被引:114
作者
Malyshev, MV [1 ]
Donnelly, VM [1 ]
机构
[1] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
关键词
D O I
10.1063/1.372072
中图分类号
O59 [应用物理学];
学科分类号
摘要
The goal of the study that begins with this paper is the creation of a base set of parameters (densities and temperatures or energy distributions of all charged and neutral species) in a chlorine transformer-coupled plasma, measured with the same commercial plasma source over an extensive range of pressure and power. Electron temperatures T-e and electron energy distribution functions (EEDFs) are reported as a function of pressure (1-20 mTorr) and power (10-1000 W) during slow etching of SiO2-covered Si wafers. T-e values are obtained both by trace rare gases optical emission spectroscopy and Langmuir probe methods. EEDFs are obtained with the Langmuir probe. A zero-dimensional (global) model with revised rate coefficients is used to compute T-e from both minimum (pressure, total plasma density, gas temperature, and wall recombination coefficient) and maximum (all experimentally measured parameters necessary to calculate T-e) sets of input parameters. (C) 2000 American Institute of Physics. [S0021-8979(00)06304-0].
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页码:1642 / 1649
页数:8
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