Bayesian closed-loop robust process design considering model uncertainty and data quality

被引:25
作者
Ouyang, Linhan [1 ]
Chen, Jianxiong [2 ]
Ma, Yizhong [3 ]
Park, Chanseok [4 ]
Jin, Jionghua [5 ]
机构
[1] Nanjing Univ Aeronaut & Astronaut, Coll Econ & Management, Nanjing, Jiangsu, Peoples R China
[2] Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou, Fujian, Peoples R China
[3] Nanjing Univ Sci & Technol, Sch Econ & Management, Nanjing, Jiangsu, Peoples R China
[4] Pusan Natl Univ, Dept Ind Engn, Busan, South Korea
[5] Univ Michigan, Dept Ind & Operat Engn, Ann Arbor, MI 48109 USA
基金
新加坡国家研究基金会; 中国国家自然科学基金;
关键词
Bayesian analysis; closed-loop approach; data quality; model uncertainty; robust process design; SURFACE OPTIMIZATION; PROCESS ADJUSTMENT;
D O I
10.1080/24725854.2019.1636428
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Response-surface-based design optimization has been commonly used in Robust Process Design (RPD) to seek optimal process settings for minimizing the output variability around a target value. Recently, the online RPD strategy has attracted increasing research attention, as it is expected to provide a better performance than offline RPD by utilizing online process feedback to continuously adjust process settings during process operation. However, the lack of knowledge about process model parameter uncertainty and data quality in the online RPD decisions means that this superiority cannot be guaranteed. This motivates this article to present a Bayesian approach for online RPD, which can provide systematic decisions of when and how to update the process model parameters for online process design optimization by considering data quality. The effectiveness of the proposed approach is illustrated with both simulation studies and a case study on a micro-milling process. The comparison results demonstrate that the proposed approach can achieve a better process performance than two conventional design approaches that do not consider the data quality and model parameter uncertainty.
引用
收藏
页码:288 / 300
页数:13
相关论文
共 28 条
[1]  
Allen TT., 2006, INTRO ENG STAT 6 SIG
[2]  
[Anonymous], 2015, DESIGN ANAL SIMULATI
[3]  
[Anonymous], 2009, RESPONSE SURFACE MET
[4]   A cautious approach to robust design with model parameter uncertainty [J].
Apley, Daniel W. ;
Kim, Jeongbae .
IIE TRANSACTIONS, 2011, 43 (07) :471-482
[5]  
Casella G., 2002, STAT INFERENCE
[6]   A prediction-correction scheme for microchannel milling using femtosecond laser [J].
Chen, Jianxiong ;
Zhou, Xiaolong ;
Lin, Shuwen ;
Tu, Yiliu .
OPTICS AND LASERS IN ENGINEERING, 2017, 91 :115-123
[7]   Robust parameter design with feedback control [J].
Dasgupta, Tirthankar ;
Wu, C. F. Jeff .
TECHNOMETRICS, 2006, 48 (03) :349-360
[8]   An adaptive run-to-run optimizing controller for linear and nonlinear semiconductor processes [J].
Del Castillo, E ;
Yeh, JY .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1998, 11 (02) :285-295
[9]   Online automatic process control using observable noise factors for discrete-part manufacturing [J].
Jin, JH ;
Ding, Y .
IIE TRANSACTIONS, 2004, 36 (09) :899-911
[10]  
Juran J., 1993, Quality planning and analysis