Improved Control and Characterization of Adjustable X-ray Optics

被引：10

作者：

Allured, Ryan ^{[1
]}

Ben-Ami, Sagi ^{[1
]}

Cotroneo, Vincenzo ^{[1
]}

Marquez, Vanessa ^{[1
]}

McMuldroch, Stuart ^{[1
]}

Reid, Paul B. ^{[1
]}

Schwartz, Daniel A. ^{[1
]}

Trolier-McKinstry, Susan ^{[2
]}

Vikhlinin, Alexey A. ^{[1
]}

Wallace, Margeaux L. ^{[2
]}

机构：

[1] Harvard Smithsonian Ctr Astrophys, Cambridge, MA 02138 USA

[2] Penn State Univ, University Pk, PA 16802 USA

来源：

OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VII | 2015年 / 9603卷

关键词：

D O I：

10.1117/12.2186411

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

We report on improvements in our efforts to control and characterize piezoelectrically adjustable, thin glass optics. In the past, an optical profilometer and a Shack-Hartmann wavefront sensor have been used to measure influence functions for a flat adjustable mirror. An electronics system has since been developed to control > 100 actuator cells and has been used in a full calibration of a high-yield flat adjustable mirror. The calibrated influence functions have been used to induce a pre-determined figure change to the mirror, representing our first attempt at figure control of a full mirror. Furthermore, we have adapted our metrology systems for cylindrical optics, allowing characterization of Wolter-type mirrors. We plan to use this metrology to perform the first piezoelectric figure correction of a cylindrical mirror over the next year.

引用

页数：10

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