Panel: Reliability of Data Centers: Hardware vs. Software

被引：0

作者：

Tahoori, M. ^{[1
]}

Parulkar, Ishwar

Alexandrescu, Dan ^{[2
]}

Granlund, Kevin ^{[3
]}

Silburt, Allan ^{[4
]}

Vinnakota, Bapi ^{[5
]}

机构：

[1] KIT Germany, Karlsruhe, Germany

[2] iRoc, Grenoble, France

[3] EMC, Mandville, LA USA

[4] Cisco, San Jose, CA USA

[5] Intel, Santa Clara, CA USA

来源：

2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010) | 2010年

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1620 / 1620

页数：1

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