Panel: Reliability of Data Centers: Hardware vs. Software

被引：0
|
作者：
Tahoori, M. [1 ]
Parulkar, Ishwar
Alexandrescu, Dan [2 ]
Granlund, Kevin [3 ]
Silburt, Allan [4 ]
Vinnakota, Bapi [5 ]
机构：
[1] KIT Germany, Karlsruhe, Germany
[2] iRoc, Grenoble, France
[3] EMC, Mandville, LA USA
[4] Cisco, San Jose, CA USA
[5] Intel, Santa Clara, CA USA
来源：
2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010) | 2010年
关键词：
D O I：
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中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1620 / 1620
页数：1
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