Double gate-MOSFET subthreshold circuit for ultralow power applications

被引:45
作者
Kim, JJ [1 ]
Roy, K
机构
[1] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
[2] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
关键词
CMOS subthreshold logic; double gate (DG)-MOSFET; leakage current; subthreshold slope; ultralow power;
D O I
10.1109/ted.2004.833965
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we propose MOSFETs that are suitable for subthreshold digital circuit operations. The MOSFET subthreshold circuit would use subthreshold leakage current as the operating current to achieve ultralow power consumption when speed is not of utmost importance. We derive the theoretical limit of delay and energy consumption in MOSFET subthreshold circuit, and show that devices that have an ideal subthreshold slope are optimal for subthreshold operations due to the smaller gate capacitance, as well as the higher current. The analysis suggests that a double gate (DG)-MOSFET is promising for subthreshold operations due to its near-ideal subthreshold slope. The results of our investigation into the optimal device characteristics for DG-MOSFET subthreshold operation show that devices with longer channel length (compared to minimum gate length) can be used for robust subthreshold operation without any loss of performance. In addition, it is shown that the source and drain structure of DG-MOSFET can be simplified for subthreshold operations since source and drain need not be raised to reduce the parasitic resistance.
引用
收藏
页码:1468 / 1474
页数:7
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