Radiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Prediction

被引:20
作者
Vargas, Vanessa [1 ,2 ,3 ]
Ramos, Pablo [1 ,2 ,3 ]
Ray, Vincent [4 ]
Jalier, Camille [4 ]
Stevens, Renaud [4 ]
De Dinechin, Benoit Dupont [4 ]
Baylac, Maud [5 ,6 ]
Villa, Francesca [5 ,6 ]
Rey, Solenne [5 ,6 ]
Zergainoh, Nacer-Eddine [7 ,8 ]
Mehaut, Jean-Francois [8 ,9 ]
Velazco, Raoul [7 ,8 ]
机构
[1] Univ Fuerzas Armadas, ESPE, DEEE, Sangolqui, Ecuador
[2] Univ Grenoble Alpes, F-38000 Grenoble, France
[3] TIMA Labs, F-38000 Grenoble, France
[4] Soc Kalray, F-38330 Montbonnot St Martin, France
[5] Univ Grenoble Alpes, LPSC, F-38000 Grenoble, France
[6] CNRS IN2P3, F-38000 Grenoble, France
[7] Univ Grenoble Alpes, TIMA Labs, F-38000 Grenoble, France
[8] CNRS, F-38000 Grenoble, France
[9] Univ Grenoble Alpes, LIG Labs, F-38000 Grenoble, France
关键词
Accelerated testing; fault injection; many-core; parallel processing; SEE; SEFI; SEU; soft error; SENSITIVITY;
D O I
10.1109/TNS.2016.2638081
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor having implemented 16 compute clusters, each one with 16 processing cores. The SEU error-rate of an application implemented in the device is predicted by combining experimental results with those issued from fault injection campaigns applying the CEU (Code Emulating Upsets) approach. In addition, a comparison of the dynamic tests when processing-cores cache memories are enabled and disabled is presented. The experiments were validated through radiation ground testing performed with 14 MeV neutrons on the MPPA-256 many-core processor manufactured in TSMC CMOS 28HP technology. An analysis of the erroneous results in processor GPRs was carried-out in order to explain their possible causes.
引用
收藏
页码:483 / 490
页数:8
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