4H polytype grain formation in PVT-grown 6H-SiC ingots

被引:7
|
作者
Fujimoto, T [1 ]
Katsuno, M [1 ]
Ohtani, N [1 ]
Aigo, T [1 ]
Yashiro, H [1 ]
机构
[1] Nippon Steel Corp Ltd, Adv Technol Res Lab, Futtsu, Chiba 2938511, Japan
关键词
crystal orientation; multi-domain ingot; X-ray pole figure;
D O I
10.4028/www.scientific.net/MSF.389-393.47
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Multi-domained PVT (physical vapor transport)-grown 6H-SiC ingots, in which large 4H-SiC grains exist with their crystal directions strongly misoriented with regard to the single crystal matrix geometry, are investigated extensively from the viewpoint of the generation mechanism of the misoriented grains. Microstructural observations reveal that there exist a number of fine SiC inclusions inside the 6H-SiC matrix. We suggest that these inclusions are likely to be the embryos of the misoriented grains.
引用
收藏
页码:47 / 50
页数:4
相关论文
共 50 条
  • [21] Electrical and optical characterisation of vanadium in 4H and 6H-SiC
    Lauer, V
    Brémond, G
    Souifi, A
    Guillot, G
    Chourou, K
    Anikin, M
    Madar, R
    Clerjaud, B
    Naud, C
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 61-2 : 248 - 252
  • [22] Application of 6H to 4H Polytype Conversion to Effective Reduction of Micropipes in 4H SiC Crystals
    Grasza, Krzysztof
    Tymicki, Emil
    SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 31 - 34
  • [23] Thermoluminescence and related electronic processes of 4H/6H-SiC
    Stiasny, T
    Helbig, R
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 162 (01): : 239 - 249
  • [24] Polytype switching identification in 4H-SiC single crystal grown by PVT
    Arora, Aman
    Pandey, Akhilesh
    Patel, Ankit
    Dalal, Sandeep
    Yadav, Brajesh S.
    Goyal, Anshu
    Raman, R.
    Thakur, O. P.
    Tyagi, Renu
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2020, 31 (19) : 16343 - 16351
  • [25] Polytype switching identification in 4H-SiC single crystal grown by PVT
    Aman Arora
    Akhilesh Pandey
    Ankit Patel
    Sandeep Dalal
    Brajesh S. Yadav
    Anshu Goyal
    R. Raman
    O. P. Thakur
    Renu Tyagi
    Journal of Materials Science: Materials in Electronics, 2020, 31 : 16343 - 16351
  • [26] Frank Dislocations Generation and Behavior Investigation in PVT-Grown 4H-SiC Crystals
    Hu, Shanshan
    Chen, Zeyu
    Raghothamachar, Balaji
    Dudley, Michael
    JOURNAL OF ELECTRONIC MATERIALS, 2025,
  • [27] Study of nitrogen incorporation in 6H-SiC single crystals grown by PVT
    Schulz, D
    Irmscher, K
    Dolle, J
    Eiserbeck, W
    Müller, T
    Rost, HJ
    Siche, D
    Wagner, G
    Wollweber, J
    SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 : 87 - 90
  • [28] The relationship between micropipes and screw dislocations in PVT grown 6H-SiC
    Giocondi, J
    Rohrer, GS
    Skowronski, M
    Balakrishna, V
    Augustine, G
    Hobgood, HM
    Hopkins, RH
    III-NITRIDE, SIC AND DIAMOND MATERIALS FOR ELECTRONIC DEVICES, 1996, 423 : 539 - 544
  • [29] Factors affecting the formation of misoriented domains in 6H-SiC single crystals grown by PVT method
    Peng, T. H.
    Yang, H.
    Jian, J. K.
    Wang, W. J.
    Wang, W. Y.
    Chen, X. L.
    CRYSTAL RESEARCH AND TECHNOLOGY, 2009, 44 (04) : 357 - 362
  • [30] Effect of the Seed Polarity for High Quality 4H-SiC Crystal Grown on 6H-SiC Seed by PVT Method
    Yeo, Im-Gyu
    Lee, Tae-Woo
    Park, Jong-Hwi
    Yang, Woo-Sung
    Ryu, Heui-Bum
    Park, Mi-Seon
    Kim, Il-Soo
    Shin, Byoung-Chul
    Leet, Won-Jae
    Eun, Tai-Hee
    Lee, Seung-Seok
    Chun, Myong-Chuel
    SILICON CARBIDE AND RELATED MATERIALS 2010, 2011, 679-680 : 44 - +