Model-based phase shifting interferometry

被引:80
作者
Deck, Leslie L. [1 ]
机构
[1] Zygo Corp, Middlefield, CT 06455 USA
关键词
ALGORITHM; VIBRATION; ERRORS;
D O I
10.1364/AO.53.004628
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A general method of surface profiling with phase-shifting interferometry techniques uses iterative linear regression to fit the sequence of interferograms to a physical model of the cavity. The physical model incorporates all important cavity influences, including environmentally induced rigid-body motion, phase shifter miscalibrations, multiple interference, geometry-induced spatial phase-shift variations, and their cross-couplings. By incorporating an initial estimate of the surface profile and iteratively solving for space-and time-dependent variables separately, convergence is robust and rapid. The technique has no restriction on surface shape or departure. (C) 2014 Optical Society of America
引用
收藏
页码:4628 / 4636
页数:9
相关论文
共 20 条
[1]  
[Anonymous], U.S. patents, Patent No. [7,796,273, 7796273]
[2]  
[Anonymous], U.S. patents, Patent No. [7,948,639, 7948639]
[3]  
[Anonymous], U.S. patents, Patent No. [7,796,275, 7796275]
[4]   Algorithm immune to tilt phase-shifting error for phase-shifting interferometers [J].
Chen, MY ;
Guo, HW ;
Wei, CL .
APPLIED OPTICS, 2000, 39 (22) :3894-3898
[5]   Measurement of transparent plates with wavelength-tuned phase-shifting interferometry [J].
de Groot, P .
APPLIED OPTICS, 2000, 39 (16) :2658-2663
[6]   Correlated errors in phase-shifting laser Fizeau interferometry [J].
de Groot, Peter J. .
APPLIED OPTICS, 2014, 53 (19) :4334-4342
[7]  
Deck L., 2011, U.S. patent, Patent No. [7,948,639, 7948639]
[8]  
Deck L L, 2010, US Patent, Patent No. [7,796,273, 7796273]
[9]  
Deck L L, 2010, US Patent, Patent No. [7,796,275, 7796275]
[10]   Suppressing phase errors from vibration in phase-shifting interferometry [J].
Deck, Leslie L. .
APPLIED OPTICS, 2009, 48 (20) :3948-3960