A Memory Structure with Different Control Gates

被引:10
作者
Dai, Mingzhi [1 ]
Guan, Jianmin [1 ]
Song, Zhitang [2 ]
机构
[1] Chinese Acad Sci, Ningbo Inst Mat Technol & Engn, Ningbo 315201, Zhejiang, Peoples R China
[2] Chinese Acad Sci, Shanghai Microsyst & Informat Technol Inst, Shanghai 200433, Peoples R China
基金
中国国家自然科学基金;
关键词
fast programming time; one-transistor memory; control gate; DRAM; junction; THIN-FILM TRANSISTORS; SOLAR-CELLS; TIN; TEMPERATURE; TRANSPARENT; PERFORMANCE;
D O I
10.1002/aelm.201800186
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Memory is a key and fundamental component in integrated circuits (IC). A dominant volatile memory is the dynamic random access memory (DRAM) with one transistor and one capacitor, whose footprint is comparable to about two transistors. Memory structure needs further simplification according to IC's scaling-down requirement. However, most updated structures at present are still mainly limited in lab. Here, a memory structure with one transistor is demonstrated. The advantages of this new structure over conventional memory structures include the simplification of the structure by saving a capacitor space in DRAM, and thus the simplification of fabrication process. Typical characterization of the memory device is also performed, and very quick response time (approximate to 1 ns), which is faster than most present memories in the foundry, that is, 2 ns or more, is reported. Both simulation and experiments are performed to explain the memory working mechanism. The memory programming functions are implemented through the junction caused by control gate. This structure could be scaled down by using lithography processes in the foundry, which could ensure a fair reliability and enable immediate applications for information technology electronics as a potential alternative candidate for DRAM.
引用
收藏
页数:7
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