Vibration dynamics and interfacial chemistry of the CdSe/BeTe interface

被引:6
作者
Muck, T [1 ]
Wagner, JW
Hansen, L
Wagner, V
Geurts, J
Ivanov, SV
机构
[1] Univ Wurzburg, Inst Phys, D-97074 Wurzburg, Germany
[2] Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
基金
俄罗斯基础研究基金会;
关键词
D O I
10.1103/PhysRevB.69.245314
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present ab initio calculations of the geometric structure and the vibration dynamics of CdSe/BeTe interfaces by density-functional theory and the frozen phonon approach, as well as an experimental investigation of the interface phonon modes by Raman spectroscopy. The interfaces are formed from BeTe stacks with embedded CdSe monolayers. They were grown systematically, either with Be-Se or with Cd-Te interfacial bonds. The experimental results reveal a clearly superior sample quality in the case of Cd-Te bonds. The Raman peaks of the interface vibrations appear in the wave number range between 170 cm(-1) and 220 cm(-1). Beside the eigenfrequencies, the polarization properties and resonant behavior of the Raman signals are investigated. The results are described quantitatively by the theory, given the assumption of an admixture of BeSe in the upper interfaces of the CdSe layers and a lateral distribution of regions with a CdSe thickness of either one or two monolayers.
引用
收藏
页码:245314 / 1
页数:9
相关论文
共 38 条
[1]  
ABSTREITER G, 1984, TOPICS APPL PHYS, V54
[2]  
[Anonymous], 1976, JGLAC, DOI DOI 10.1017/S002214300001354X
[3]   Density-functional theory calculations for poly-atomic systems: electronic structure, static and elastic properties and ab initio molecular dynamics [J].
Bockstedte, M ;
Kley, A ;
Neugebauer, J ;
Scheffler, M .
COMPUTER PHYSICS COMMUNICATIONS, 1997, 107 (1-3) :187-222
[4]  
Cardona M., 1984, LIGHT SCATTERING SOL, P5
[5]   APPLICATION OF A MODIFIED RANDOM-ELEMENT-ISODISPLACEMENT MODEL TO LONG-WAVELENGTH OPTIC PHONONS OF MIXED CRYSTALS [J].
CHANG, IF ;
MITRA, SS .
PHYSICAL REVIEW, 1968, 172 (03) :924-&
[6]   Density functional calculation of semiconductor surface phonons [J].
Fritsch, J ;
Schröder, U .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1999, 309 (4-6) :209-331
[7]   INTERFACE CHARACTERIZATION OF INAS/ALSB HETEROSTRUCTURES BY FAR-INFRARED OPTICAL SPECTROSCOPY [J].
FUCHS, F ;
SCHMITZ, J ;
SCHWARZ, K ;
WAGNER, J ;
RALSTON, JD ;
KOIDL, P ;
GADALETA, C ;
SCAMARCIO, G .
APPLIED PHYSICS LETTERS, 1994, 65 (16) :2060-2062
[8]   The characterization of semiconductor layer and interface quality with special reference to Raman spectroscopy [J].
Geurts, J .
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1996, 32 (04) :185-224
[9]   ANALYSIS OF BAND BENDING AT III-V-SEMICONDUCTOR INTERFACES BY RAMAN-SPECTROSCOPY [J].
GEURTS, J .
SURFACE SCIENCE REPORTS, 1993, 18 (1-3) :1-89
[10]  
GUERTS J, 1998, P 24 INT C PHYS SEM