Compact thermal modeling for temperature-aware design

被引:0
作者
Huang, W [1 ]
Stan, MR [1 ]
Skadrons, K [1 ]
Sankaranarayanan, K [1 ]
Ghosh, S [1 ]
Velusamy, S [1 ]
机构
[1] Univ Virginia, Dept Elect & Comp Engn, Charlottesville, VA 22903 USA
来源
41ST DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2004 | 2004年
关键词
design; algorithms; temperature-aware design; temperature-aware computing; thermal model; power-aware design; leakage; reliability;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Thermal design in sub-100nm technologies is one of the major challenges to the CAD community. In this paper, we first introduce the idea of temperature-aware design. We then propose a compact thermal model which can be integrated with modem CAD tools to achieve a temperature-aware design methodology. Finally, we use the compact thermal model in a case study of microprocessor design to show the importance of using temperature as a guideline for the design. Results from our thermal model show that a temperature-aware design approach can provide more accurate estimations, and therefore better decisions and faster design convergence.
引用
收藏
页码:878 / 883
页数:6
相关论文
共 20 条
[1]  
[Anonymous], 2003, INT TECHNOLOGY ROADM
[2]  
[Anonymous], CS200413 U VIRG DEP
[3]  
Bakoglu H., 1990, CIRCUITS INTERCONNEC
[4]   3-D ICs: A novel chip design for improving deep-submicrometer interconnect performance and systems-on-chip integration [J].
Banerjee, K ;
Souri, SJ ;
Kapur, P ;
Saraswat, KC .
PROCEEDINGS OF THE IEEE, 2001, 89 (05) :602-633
[5]  
BATTY W, 2002, MICROWAVE THEORY TEC, P2820
[6]  
Brooks D, 2000, PROCEEDING OF THE 27TH INTERNATIONAL SYMPOSIUM ON COMPUTER ARCHITECTURE, P83, DOI [10.1145/342001.339657, 10.1109/ISCA.2000.854380]
[7]   A stochastic wire-length distribution for gigascale integration (GSI) - Part I: Derivation and validation [J].
Davis, JA ;
De, VK ;
Meindl, JD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (03) :580-589
[8]   EDA challenges facing future microprocessor design [J].
Kam, T ;
Rawat, S ;
Kirkpatrick, D ;
Roy, R ;
Spirakis, GS ;
Sherwani, N ;
Peterson, C .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2000, 19 (12) :1498-1506
[9]   Two benchmarks to facilitate the study of compact thermal modeling phenomena [J].
Lasance, CJM .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2001, 24 (04) :559-565
[10]  
Lee S., 1995, ASMEJSME THERMAL ENG, V4, P199