Design and High-Speed Tests of a Single-Flux-Quantum Time-to-Digital Converter for Time-of-Flight Mass Spectrometry

被引：0
|
作者：
Sano, K. [1 ]
Takahashi, A. [1 ]
Yamanashi, Y. [1 ]
Yoshikawa, N. [1 ]
Zen, N. [2 ]
Suzuki, K. [2 ]
Ohkubo, M. [2 ]
机构：
[1] Yokohama Natl Univ, Dept Elect & Comp Engn, Yokohama, Kanagawa 240, Japan
[2] AIST, Res Inst Instrumentat Frontier, Tsukuba, Ibaraki, Japan
来源：
2013 IEEE 14TH INTERNATIONAL SUPERCONDUCTIVE ELECTRONICS CONFERENCE (ISEC) | 2013年
关键词：
Josephson integrated circuits; SFQ circuits; TDC; mass spectrometry; SSID; FIFO;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We are developing a single-flux-quantum (SFQ) time-to-digital converter (TDC) for time-of-flight mass spectrometry (TOF MS) system. In this study, we designed and tested a 24-bit SFQ TDC with a 3 x 24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100 ps and 1.6 ms, respectively. The TDC design was improved to reduce the total junction numbers and the bias current in order to install it in a 4.2 K cryo-cooler. We confirmed the operation of the TDC and evaluated the jitter by measuring a histogram of TDC read out.
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页数：3
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