Specular neutron reflection at the mica/water interface - irreversible adsorption of a cationic dichain surfactant

被引:15
作者
Browning, Kathryn Louise [1 ]
Griffin, Lucy Rachael [1 ]
Gutfreund, Philipp [2 ]
Barker, Robert David [2 ]
Clifton, Luke Ashley [3 ]
Hughes, Arwel [3 ]
Clarke, Stuart Matthew [1 ]
机构
[1] Univ Cambridge, BP Inst, Cambridge CB3 0EZ, England
[2] Inst Laue Langevin, Grenoble, France
[3] Rutherford Appleton Lab, ISIS, Didcot OX11 0QX, Oxon, England
来源
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2014年 / 47卷
关键词
MICA SURFACES; DIDODECYLDIMETHYLAMMONIUM BROMIDE; LIQUID INTERFACES; RAY REFLECTIVITY; SYSTEM; FORCES; BILAYERS; FILMS; REFLECTOMETRY; ORGANIZATION;
D O I
10.1107/S1600576714016318
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Neutron reflection from the important mineral mica at the solid/liquid interface is presented here using a new approach - a very thin mica crystal supported on a silicon substrate. This approach avoids the problems of crystal defects and surface undulations that have hindered previous work. The use of mica as a reflectivity substrate is important as it is a model surface, which is atomically smooth with a high structural charge. In this work the mica/water interface is fully characterized. In particular, a characteristic double critical edge is observed, arising from the higher scattering length densities of the mica and D2O subphase relative to the silicon support. The experimental data are modelled using a combined approach: conventional amplitude summation (matrix method) for the thin layers and reflected intensity summation with attenuation terms for the thick layers of mica and hydrocarbon adhesive. Reflection data from the adsorption of the dichain cationic surfactant didodecyldimethylammonium bromide (DDAB) to the surface of muscovite mica from aqueous solution are also presented. It is found that, at twice the critical micelle concentration, a bilayer of DDAB with a thickness of 24 angstrom is observed, containing essentially no water. Its partial removal by washing and ion exchange is also presented. (C) 2014 International Union of Crystallography
引用
收藏
页码:1638 / 1646
页数:9
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